Authors: Roorda S; Sinke WC; Poate JM; Jacobson DC; Dierker S; Dennis BS; Eaglesham DJ; Spaepen F; Fuoss P
Journal: Physical review. B, Condensed matter Volume: 44 Issue: 8 Pages: 3702-3725 Date: Aug. 15, 1991 PMID: 9999999 |
Roorda S, Sinke WC, Poate JM, Jacobson DC, Dierker S, Dennis BS, Eaglesham DJ, Spaepen F, Fuoss P (1991) Structural relaxation and defect annihilation in pure amorphous silicon. Physical review. B, Condensed matter 44: 3702-3725.
Comment on This Data Unit